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Test data Volume Reduction Using Compressed Scan Mode Architecture

Publication Type : Conference Proceedings

Publisher : Elsevier

Source : International Conference on Communication and Computing, ICC 2014. Elsevier, Bangalore, India, 2014.

Campus : Coimbatore

School : School of Engineering

Department : Electronics and Communication

Verified : Yes

Year : 2014

Abstract :

Cite this Research Publication : M. Vijitha and Dr. Nirmala Devi M., “Test data Volume Reduction Using Compressed Scan Mode Architecture”, International Conference on Communication and Computing, ICC 2014. Elsevier, Bangalore, India, 2014.

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