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Systems and Methods for Yaw Estimation

Publication Type : Patents

Source : Patent Number: 20170132453 US Patent for Image Analysis - Facial Features

Campus : Amritapuri

Center : E-Learning

Year : 2017

Abstract :

Cite this Research Publication : A. Sankaranarayanan and Kamal Bijlani, “Systems and Methods for Yaw Estimation”, 2017.

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