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Publication Type : Journal Article
Source : Consumer Electronics Times, Vol. 2, Issue 3, pp. 116 – 123, July 2013, [Special Invited Paper].
Campus : Chennai
School : School of Engineering
Department : Computer Science and Engineering
Year : 2013
Abstract :
Cite this Research Publication : S.Natarajan, J.A.Lee, F.Mehdipour, N.Ramadass and Y.V.Ramana Rao, “Scalable Error Detection Coding© (SEDC) Algorithm for Totally Self-Checking (TSC) Circuits”, Consumer Electronics Times, Vol. 2, Issue 3, pp. 116 – 123, July 2013, [Special Invited Paper].