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Repetitive feature extraction with localized delaunay triangulation for copy-move-forgery-detection

Publication Type : Journal Article

Publisher : Indian Journal of Computer Science and Engineering

Source : Indian Journal of Computer Science and Engineering, 2021, 12(5), pp. 1179–1186

Url : http://www.ijcse.com/docs/INDJCSE21-12-05-005.pdf

Campus : Kochi

School : School of Computing

Year : 2021

Abstract : The newly invented sophisticated softwares like Adobe Photoshop make the alteration of image very easy. Advanced tools are provided in these softwares that make the image look real which makes it inconvenient to be identified by the naked eye. Taking out features with key point based method using Scale Invariant Feature Transform (SIFT) is discussed in this paper. The extracted feature points are then modeled to with Delaunay Triangulation to get a group of triangles. Mean vertex descriptor of these triangles is matched. Outlier detection is done using Random Sample Consensus (RANSAC). Equivalent methods are outdone by the proposed approach in implementation.

Cite this Research Publication : Dhanya, R., Kalaiselvi, R., "Repetitive feature extraction with localized delaunay triangulation for copy-move-forgery-detection", Indian Journal of Computer Science and Engineering, 2021, 12(5), pp. 1179–1186

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