Back close

Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation

Publication Type : Journal Article

Publisher : Microelectronics Reliability

Source : Microelectronics Reliability, Volume 65, p.27 - 34 (2016)

Url : http://www.sciencedirect.com/science/article/pii/S0026271416301408

Keywords : Current starved delay cell, Linear energy transfer (LET), Phase displacement, Radiation hardened by design (RHBD), Radiation harderning, Ring VCO, Single event transient (SET)

Campus : Bengaluru

School : School of Engineering

Center : Amrita Innovation & Research

Department : Electronics and Communication

Verified : Yes

Year : 2016

Abstract : This paper analyzes the radiation tolerance of both single ended and differential ring VCO in the presence of SET in 90nm CMOS process technology. Phase displacement is an important metric in assessing the susceptibility and suitability of any frequency synthesizer in the presence of SET. Through device level characterization using Synopsys TCAD and extensive circuit level simulation and verification, for heavy ion dosage with LET between 20 ((MeV-cm2)/mg) and 200 ((MeV-cm2)/mg), the current starved differential delay cell based 3-stage differential ring VCO exhibits a phase displacement improvement of around 20% compared to a current starved inverter based single ended ring VCO oscillating at 420MHz. When the number of stages in differential ring VCO are increased from 3 to 7 the phase displacement is reduced by a factor of 57%. However, to achieve similar phase displacement improvement in inverter based single ended ring VCO required in excess of 15 stages. The active area for the differential ring VCO decreases by almost 40% as the number of stages increases.

Cite this Research Publication : P. Maran, N. Vinodhkumar, R. Srinivasan, and Premanand Venkatesh Chandramani, “Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation”, Microelectronics Reliability, vol. 65, pp. 27 - 34, 2016.

Admissions Apply Now