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Moments of order statistics using the orthogonal inverse expansion method and its application in reliability

Publication Type : Journal Article

Publisher : Microelectronics Reliability

Source : Microelectronics Reliability, Volume 32, Number 4, p.469 - 473 (1992)

Url : http://www.sciencedirect.com/science/article/pii/002627149290474Y

Campus : Coimbatore

School : School of Engineering

Center : Computational Engineering and Networking

Department : Electronics and Communication

Year : 1992

Abstract : Moments of order statistics have widespread use in life-testing and reliability studies. The orthogonal inverse expansion method is a unique method which allows one to obtain moments and product moments of order statistics of any distribution. In the present paper, we demonstrate the application of the orthogonal inverse expansion method to compute moments of order statistics and the use of these moments in various reliability studies.

Cite this Research Publication : Dr. Soman K. P. and Misra, K. B., “Moments of order statistics using the orthogonal inverse expansion method and its application in reliability”, Microelectronics Reliability, vol. 32, pp. 469 - 473, 1992.

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