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Publication Type : Conference Proceedings
Publisher : Springer Singapore
Source : Security in Computing and Communications, Springer Singapore, Volume 625, Singapore, p.414-426 (2016)
ISBN : 9789811027383
Campus : Coimbatore
School : School of Engineering
Center : Amrita Innovation & Research
Department : Electronics and Communication
Verified : Yes
Year : 2016
Abstract : As the manufacturing processes become more and more advanced as per Moore's law, precise control of silicon process is becoming more and more challenging. This increases the probability of defects and has brought a necessity for testing to ensure fault-free products, making the testing of a chip more complex causing testing challenges.
Cite this Research Publication : E. R. Midhila, Swaminathan, A., Lekshmi, B., and Dr. Anita J. P., “Diagnosis of Multiple Stuck-at Faults Using Fault Element Graph with Reduced Power”, Security in Computing and Communications, vol. 625. Springer Singapore, Singapore, pp. 414-426, 2016.