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Capacitance based Non-destructive technique for post-harvest sugarcane quality prediction

Publication Type : Journal Article

Publisher : IEEE

Source : 2019 9th International Symposium on Embedded Computing and System Design (ISED)

Url : https://ieeexplore.ieee.org/document/9096248

Campus : Coimbatore

School : School of Engineering

Department : Electronics and Communication

Year : 2019

Abstract : Post-harvest deterioration of sugarcane quality is one of the major issues that affect sugar production in sugar industries. There is a need for an effective technique that could quickly measure sugarcane quality without pre-processing the sugarcane stalks. This study was intended to create a capacitance-based setup capable of predicting °brix through nondestructive testing. The setup measures relative permittivity values which along with weight is used to predict the value of °brix in sugarcane stalks. A 5V sinusoidal wave of 5 different frequencies in the range 1 kHz - 1 MHz was swept across the parallel plate capacitor with sugarcane stalk samples as the dielectric medium. A total of three hundred stalks from four commercial varieties of sugarcane (CO 95020, CO 86010, CO 86032 and CO 06022) were used for the analysis. A predictive model for °brix was built using multiple linear regression, random forest and artificial neural networks. Feature selection revealed that relative permittivity at 1kHz frequency and weight were highly capable of predicting °brix. The best prediction was obtained from the random forest model with a coefficient of determination (Rv 2 ) of 0.942.

Cite this Research Publication : S. Arumugam, H. Theivaprakasham, M. R. Kamakshidevi, R. Suburaaj and Sabarish Narayanan B, "Capacitance based Non-destructive technique for post-harvest sugarcane quality prediction," 2019 9th International Symposium on Embedded Computing and SystemDesign(ISED), Kollam, India, 2019, pp. 1-5, doi: 10.1109/ ISED 48680. 2019. 9096248.

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