Publication Type : Journal Article
Publisher : Microelectronics Reliability
Source : Microelectronics Reliability, Volume 33, Number 9, p.1241 - 1244 (1993)
Url : http://www.sciencedirect.com/science/article/pii/002627149390124H
Campus : Coimbatore
School : School of Engineering
Center : Computational Engineering and Networking
Department : Electronics and Communication
Year : 1993
Abstract : The K-terminal reliability of a network is defined. It is evaluated using K-trees obtained from spanning trees of the network graph. A simple algorithm for generating the K-trees is proposed. The method is suitable for small networks and also for large networks if K is greater than half the total number of nodes. Changing all logical variables into their analogous probability variables in the mutually disjointed sum of the K-trees gives K-terminal reliability of the network. The method is straightforward and easy to program. The examples illustrate the method.
Cite this Research Publication : D. Rath and Dr. Soman K. P., “A simple method for generating K-trees of a network”, Microelectronics Reliability, vol. 33, pp. 1241 - 1244, 1993.