Publication Type : Journal Article
Publisher : Microelectronics Reliability
Source : Microelectronics Reliability, Volume 32, Number 3, p.303 - 305 (1992)
Url : http://www.sciencedirect.com/science/article/pii/002627149290057R
Campus : Coimbatore
School : School of Engineering
Center : Computational Engineering and Networking
Department : Electronics and Communication
Year : 1992
Abstract : The present paper applies a least square method to estimate parameters of a Weibull distribution, with the shape parameter lying in the range 0–3, where other methods like the maximum likelihood method are generally not applicable. Further, Fisher's F-test is employed to find the goodness of fit of a straight line. Two approximate methods have also been developed for the remaining range of the shape parameter. Illustrations are provided wherever necessary.
Cite this Research Publication : Dr. Soman K. P. and Misra, K. B., “A Least Square Estimation of Three Parameters of a Weibull Distribution”, Microelectronics Reliability, vol. 32, pp. 303 - 305, 1992.