Year : 2016
A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults
Cite this Research Publication :
N. Mohan and Dr. Anita J. P., “A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults”, International Journal of Mathematical Modelling and Numerical Optimisation, vol. 7, pp. 83-96, 2016.
Publisher : Inderscience Enterprises Ltd.
Year : 2014
N-Detect Test Pattern Generation And Relaxation Using ZDD
Cite this Research Publication :
B. D. Kumar Reddy and Mohan, N., “N-Detect Test Pattern Generation And Relaxation Using ZDD”, International Journal of Electrical, Electronics and Data Communication, vol. 2, no. 7, p. Online-Ressource, 2014.
Publisher : International Journal of Electrical, Electronics and Data Communication