Course

Unit 1

Preparation and characterization of microelectronic devices 

Study of Zener diode, diode based half/full-wave rectifier, Metal-semiconductor Schottky diode fabrication, thin film field effect transistor, BJT transistor (BC 547) as amplifier and switch. Characterization of nanomaterials.

Unit 2

Optical properties of materials and devices 

UV-VIS Spectroscopy, Optical reflectance/transmittance and luminescence. Opto-electronic properties of bulk and thin films, electrical and optical characterization of LEDs.

Unit 3

Advanced semiconductors

Nanomaterials size-structure-property correlation, 2D materials semiconductor processing and properties. Delayering commercial IC-chip to understand microstructure and reverse engineering.

Unit 4

Mini-project: based on the experiments executed

Standards in nanomaterials assessment and device testing 

Introduction to quality assessments, ISO, IEC standard testing.

Pre-requisites: Basic understanding of experimental research

Total number of lab sessions: 15

Course Outcomes:

• Students will be able to gain hands on experience in preparation and characterization of semiconductor nanomaterials.
• Practically correlate process parameters and property (electrical, optical…etc.)
• Fabricate devices and investigate their characteristics.
• Be able to learn operation of characterization tools and independently handle the instruments.
• A comprehensive experimental understanding of electrical and optical properties of semiconductors.

1. S. M. Sze, “Physics of Semiconductor Devices”, Wiley-Interscience, 1969.
2. D. K. Schroder, “Semiconductor Material and Device Characterization”, 3^rd Edition, Wiley Publishers, 2006.