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The Major Analytical Instrumentation Facility is the central facility for advanced materials characterization at the Coimbatore Campus of Amrita Vishwa Vidyapeetham. With funds from the Ministry of Human Resource Development (MHRD – FAST Scheme), Department of Science and Technology (DST – FIST Scheme), DRDO, SERB, BARC, ISRO and Amrita Vishwa Vidyapeetham, the Facility hosts world-class equipment for materials characterization. It provides characterization and testing facilities to researchers within and outside Amrita.
Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high-resolution imaging at low accelerating voltages and small working distances. The Gemini 300 SEM provides resolution of the images as low as 2 nm at 15 kV, allowing examination of the top surface of nanopowders, nanofilm and nanofibers in wide range of applications such as mineralogy, ceramics, polymer, metallurgy, electronic devices, chemistry, physics and life sciences.
Essential Specification & Features:
Detectors:
X-ray diffraction analysis is a fast, non-destructive and environmentally friendly analysis method with very high accuracy and reproducibility. X-ray diffraction facility offers high quality diffraction data for both powder and thin film specimens including Inorganic materials, ceramics, metals, intermetallic, minerals, and composites. This facility focuses on:
Essential Specification:
Max power: 3KW, Target – Cu, Minimum step size – 0.001˚
Detector: Scintillation counter, Goniometer max range: upto 120 ˚
Attachment: STD, Thin-film, SAXS (powder & liquid)
GCMS instrument is used to obtain information for the identification, quantification, and resolution of a compound synthesized. GCMS systems are currently used in a wide variety of fields like food & beverages, pharmaceuticals, agriculture, environmental and others.
Essential Specification:
Sample Injector: Auto injector & manual injector for liquid samples and gas samples. For solid samples, direct injection mode available (DI).
Composition accuracy : +/- 0.5%
Detectors: FID, TCD and MS.
Carrier gas: Helium Gas
Thermal studies are used to study the thermal properties of the materials as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. TGA studies are includes, Thermogravimetry analyses (TGA) – change in weight and Differential Thermal Analysis (DTA) -temperature difference. This technique is widely used for polymers, organics, inorganics, metals, alloys, glass, and ceramics materials.
Essential Specification:
Simultaneous TG-DTA measurements
Temperature range: Room Temperature to 1100°C
Purge gas: Nitrogen, Pan: Alumina
DSC thermal studies are used to study the thermal properties of the materials. Here, heat flow is measured as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. This technique is widely used for polymers, organics, inorganics, metals, alloys, glass, and ceramics materials.
Essential Specification:
Thermal studies are used to study the thermal properties of the materials as a function of temperature, while the materials are subjected to a controlled temperature and atmospheric condition. TGA studies are includes, Thermogravimetry analyses (TGA) – change in weight and Differential Thermal Analysis (DTA) -temperature difference.
This technique is widely used for polymers, organics, inorganics, metals, alloys, glass, and ceramics materials.
The JASCO V-750 UV-visible spectrophotometer has an integrating sphere attachment which can be used for diffuse reflectance spectroscopy. Band gaps of materials may be determined through the diffuse reflectance spectra and Tauc plots.
Essential Specification:
Wavelength Range: 170 nm to 1100nm
Resolution: 0.1 nm.
Samples required: 20 mg.
Solvent must be specified for solution studies.
The infrared spectrum originates from the vibrational motion of the molecule. The interference pattern obtained from a two-beam interferometer as the path difference between the two beams is altered, when Fourier transformed, gives rise to the spectrum. The transformation of the interferogram into spectrum is carried out mathematically with a dedicated on-line computer. Infrared spectrum is useful in identifying the functional groups like -OH, -CN, -CO, -CH, -NH2, etc.
Essential Specification:
Wave number range: 4000 to 400 cm -1.
Resolution: 0.4 cm -1.DTGS detector, IR library
Mode: KBr mode and ATR mode
Samples required: 10 mg Powder, Thin Film (5mm min), Solid (thickness less than 5mm)
S. No. | Testing & Characterization Facility | For Other Educational Institutes | For Govt. R&D Labs | For Industries |
1 | FTIR [KBr & ATR mode] | 200 | 200 | 500 |
2 | UV | 200 | 400 | 800 |
UV-DRS | 400 | 400 | 1000 | |
3 | DSC – Only heating | 750 | 750 | 1500 |
*Heating + Cooling | *1000 | *1000 | *2000 | |
4 | TGA – upto 700 °C | 600 | 600 | 1500 |
*Above 700 °C | *800 | *800 | *2000 | |
5 | GC-MS | 1000 | 1000 | 2500 |
*GC- FID or TCD | *500 | *500 | *1500 | |
*MS- DI mode | ||||
6 | XRD – Powder | 400 | 400 | 1500 |
Normal scan | ||||
XRD – Powder | *600 | *600 | *2000 | |
*Slow scan (below 2 D) | ||||
Thin Films | 400 | 400 | 1500 | |
Normal scan | ||||
Thin Films | *600 | *600 | *2000 | |
*Slow scan (below 2 D) | ||||
7 | FE-SEM | 1000 | 1000 | 4000 |
EDAX+Colour Mapping | 400 | 400 | 2000 | |
Gold coating for non conducting materials | 200 | 200 | 800 |
Procedure for Availing Facility
The instruments are available to all the students, research scholars and faculty members of the university and affiliated institutions and also other educational institutions, research labs and industry also on chargeable basis as mentioned in the table below. The users are to submit the requisition forms with the samples.
Outstation users may contact the Centre by Mobile: 9585534354 to reserve time slot for their use and visit with the samples on the date of appointment.
The list of Requisition forms for various instruments are as follows:
Sample Submission Procedure
Payment Details
S. No. | Testing & Characterization Facility | For Other Educational Institutes | For Govt. R&D Labs | For Industries |
1 | FTIR [KBr & ATR mode] | 200 | 200 | 500 |
2 | UV | 200 | 200 | 800 |
3 | UV-DRS | 400 | 400 | 1000 |
4 | DSC – Only heating *Heating + Cooling | 750 *1000 | 750 *1000 | 1500 *2000 |
5 | TGA –upto 700 °C *Above 700 °C | 600 *800 | 600 *800 | 1500 *2000 |
6 | GC-MS *GC- FID or TCD *MS- DI mode | 1000 *500 | 1000 *500 | 2500 *1500 |
7 | XRD – Powder Normal scan XRD – Powder *Slow scan (below 2 D) Thin Films Normal scan Thin Films *Slow scan (below 2 D) | 400 *600 400 *600 | 400 *600 400 *600 | 1500 *2000 1500 *2000 |
8 | FE-SEM EDAX+ Colour Mapping Gold coating for non conducting materials | 1000 400 200 | 1000 400 200 | 4000 2000 800 |
For further details contact
R. Senthilkumar,
Technical Manager – CoE AMGT
Mobile: 9585534354
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