Publication Type : Conference Paper
Publisher : 2003.
Source : 2003.
Campus : Amritapuri
School : School of Engineering
Department : Electronics and Communication
Year : 2003
Abstract :
Cite this Research Publication : C. D. Young, Kerber, A., Hou, T. H., Cartier, E., Brown, G. A., Bersuker, G., Kim, Y., Lim, C., Gutt, J., Lysaght, P., Dr. Sundararaman Gopalan, and , “Charge trapping and mobility degradation in MOCVD hafnium silicate gate dielectric stack structures”, 2003.