| Course Name | Principles of VLSI Testing |
| Course Code | 15ECE369 |
| Program | B. Tech. in Electronics and Communication Engineering |
| Year Taught | 2019 |
Introduction – Need for testing – Role of testing – Elementary testing concepts – Fault and fault model – Defects – Errors and faults – Glossary of fault models – Single stuck-at fault – Fault equivalence – Equivalence of single stuck-at faults – Fault collapsing – Fault dominance – Checkpoint theorem.
Logic and fault simulation – Modeling circuits for simulation – Algorithms for true value simulation and fault simulation – Binary Decision Diagrams – Introduction and construction – Reduction rules and algorithms – ROBDDs – Operation on BDDs and its algorithms – Representation of digital circuits.
Combinational circuit test generation – Algebraic algorithms – Boolean difference method – Fault-table method – Path sensitizing method – ENF method – Structural algorithms – D-Algorithm – PODEM – Advanced algorithms – Fault detection – Two level circuit fault detection – Multilevel circuit fault detection. Sequential circuit test generation: Time frame expansion.
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