Publication

Abstract : In this paper, an efficient algorithm for test and diagnosis pattern generation is proposed. Diagnosis patterns are those which help in distinguishing one fault from the other such that the list of possible defects can be reduced. This algorithm gives a compact set of Test and Diagnosis Patterns (TDPs) in a single ATPG run. Here a new approach is used to generate diagnosis patterns which uses Zero suppressed Binary Decision Diagram (ZBDD). This algorithm contains three main parts, which are ZBDD based diagnosis pattern generation, Fault pair grouping, and equivalent fault pair identification. For the ISCAS’89 and ’85 benchmarks circuits considered in this work it could be observed that all the fault pairs were distinguished using a compact set of patterns. None of the fault pairs were aborted in the procedure. The proposed algorithm shows an average of 17% decrease in the number of test and diagnosis patterns as compared to previous works.