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Publication Type : Journal Article
Source : Journal of Semiconductor Technology and Science, Vol. 13, No. 5, pp. 415 – 422, October 2013. (SCIE, Scopus)
Url : https://koreascience.kr/article/JAKO201333363223785.pdf
Campus : Chennai
School : School of Engineering
Department : Computer Science and Engineering
Year : 2013
Abstract : In this paper, we present Self-Checking look-up-table (LUT) based on Scalable Error Detection Coding (SEDC) scheme for use in faulttolerant reconfigurable architectures. SEDC scheme has shorter latency than any other existing coding schemes for all unidirectional error detection and the LUT execution time remains unaffected with self- checking capabilities. SEDC scheme partitions the contents of LUT into combinations of 1-, 2-, 3- and 4- bit segments and generates corresponding check codes in parallel. We show that the proposed LUT with SEDC performs better than LUT with traditional Berger as well as Partitioned Berger Coding schemes. For 32-bit data, LUT with SEDC takes 39% less area and 6.6 times faster for self- checking than LUT with traditional Berger Coding scheme.
Cite this Research Publication : S.Natarajan and J.A. Lee, “Self-Checking Look-up Tables using Scalable Error Detection Coding (SEDC) Scheme”, Journal of Semiconductor Technology and Science, Vol. 13, No. 5, pp. 415 – 422, October 2013. (SCIE, Scopus)