Unit 1

Imaging microscopies and Image analysis: Optical Microscopy, Scanning electron microscopy, Scanning probe microscopy, X-ray microscopy and Transmission electron microscopy, Image analysis.

Unit 2

X-ray-diffraction, properties of x-rays, review of crystal systems and miller indices, stereographic projections, Laue conditions, braggs conditions, diffraction methods, phase identifications, electron diffraction methods.

Unit 3

1. Yang Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods 2013, Wiley VCH; ISBN-10: 3527334637, ISBN-13: 978-3527334636.
2. B. D. Cullity and S R Stock, Elements of X-ray diffraction, 3rd Ed., Prentice Hall 2001
3. K P. Menard Dynamic mechanical analysis: A practical introduction, CRC press, 1999