Publication Type : Journal Article
Source : Advances in Intelligent Systems and Computing ,Vol.898, pp. 447 -452, 2019
Campus : Coimbatore
School : School of Engineering
Department : Electronics and Communication
Year : 2019
Abstract : The proposed work aims at generating a diagnostic test set which is a compact test set derived from a large set of test vectors generated from any automatic test pattern generator (ATPG). This diagnostic test set is required to find out the exact location of the faults. The patterns generated from the ATPG may be sufficient to find out whether the circuit is fault free or not, but will not give the location of the fault. Hence, the proposed method aims at identifying the exact location of the faults. The experiment has been carried out on several ISCAS’85 and ISCAS’89 benchmark circuits.
Cite this Research Publication : Madhan B and J.P.Anita, “Improving diagnostic test coverage from detection test set for logic circuits”, Advances in Intelligent Systems and Computing ,Vol.898, pp. 447 -452, 2019.